MEASUREMENT DEVICE AND MEASUREMENT METHOD

专利名称：MEASUREMENT DEVICE AND

MEASUREMENT METHOD

发明人：UTSUMI, Hideo,ICHIKAWA,

Kazuhiro,KAJIWARA, Hidenori

申请号：EP09794062.1申请日：20090707公开号：EP2296546B1公开日：20160210

摘要：A measurement device and measurement method make it possible to eliminatethe load generated by stopping on a measurement subject that is moved among multiplemagnetic field generating devices. The measurement device includes a first externalmagnetic field generating device that generates a magnetic field of a set size, a secondexternal magnetic field generating device that generates a magnetic field of a size thatdiffers from that of the magnetic field of the first external magnetic field generatingdevice, a rotating table that causes the subject of measurement to pass in sequencethrough the magnetic fields of the first and second external magnetic field generatingdevices by causing the subject of measurement to move rotationally, and an OMRImeasurement processing part and MRI measurement processing part that measuresimages such as functional images or structural images of the subject of measurementwhile it is being moved rotationally by the rotating table.

申请人：UNIV KYUSHU

地址：JP

国籍：JP

代理机构：Winter, Brandl, Fürniss, Hübner, Röss, Kaiser, Polte - Partnerschaft mbB

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