Measurement device and measurement method

专利名称：Measurement device and measurement

method

发明人：Hidefumi Ibe,Tadanobu Toba,Ken-ichi

Shimbo,Hitoshi Taniguchi

申请号：US13384012申请日：20100708公开号：US08892967B2公开日：20141118

专利附图：

摘要：A logic block group having at least one set including a logic block having atleast one logic circuit and a sequential circuit that inputs the output of the logic block is

arranged in an irradiation region of a high-energy particle irradiation device, and

subjected to irradiation with high-energy particles. A control section calculates the errorrate of the logic circuit from the value obtained by subtracting the number of errors ofthe sequential circuit when the logic block of the logic block group is bypassed, from thenumber of errors of the sequential circuit and the logic block of the logic block group

申请人：Hidefumi Ibe,Tadanobu Toba,Ken-ichi Shimbo,Hitoshi Taniguchi

地址：Kawasaki JP,Yokohama JP,Yokohama JP,Yokohama JP

国籍：JP,JP,JP,JP

代理机构：Crowell & Moring LLP

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