DETERIORATION ANALYSIS METHOD AND CHEMICAL STATE M

专利名称：DETERIORATION ANALYSIS METHOD AND

CHEMICAL STATE MEASUREMENT METHOD

发明人：Fusae KANEKO,Hiroyuki KISHIMOTO申请号：US14046658申请日：20131004

公开号：US20140099723A1公开日：20140410

专利附图：

摘要：The present invention provides a deterioration analysis method capable ofanalyzing in detail deterioration of a polymer material, and in particular deterioration inthe surface condition of a polymer material with low conductivity. The present invention

relates to a deterioration analysis method including irradiating a polymer material with ametal coating having a thickness of 100 Å or less formed thereon, with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyzedeterioration of the polymer.

申请人：SUMITOMO RUBBER INDUSTRIES, LTD.

地址：Kobe-shi JP

国籍：JP

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