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Chemical Mechanical Polishing Slurries, Their Appl

来源:伴沃教育
专利内容由知识产权出版社提供

专利名称:Chemical Mechanical Polishing Slurries, Their

Applications and Method of Use Thereof

发明人:Chris Chang Yu,Andy Chunxiao Yang,Danny

Zhenglong Shiao

申请号:US11918956申请日:20060419

公开号:US20080190894A1公开日:20080814

摘要:This invention disclosed a chemical mechanical polishing slurry, which includes atleast one abrasive particle, an oxidant and a carrier. The oxidant is combined with a bigmetallorganic compound; and the applications and corresponding handling method arealso disclosed. This invention slurry can realize high removal rate, no corrosion, lowdefectivity and high plan

申请人:Chris Chang Yu,Andy Chunxiao Yang,Danny Zhenglong Shiao

地址:Shanghai CN,Shanghai CN,Shanghai CN

国籍:CN,CN,CN

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